Power performance and scalability of AlGaN/GaN power MODFETs

被引:15
作者
Alekseev, E [1 ]
Pavlidis, D
Nguyen, NX
Nguyen, C
Grider, DE
机构
[1] Univ Michigan, Dept Elect Engn & Comp Sci, Solid State Elect Lab, Ann Arbor, MI 48109 USA
[2] Hughes Res Labs, Malibu, CA 90265 USA
关键词
device measurements; microwave power amplifiers; MODFETs; semiconductor;
D O I
10.1109/22.873897
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The scalability of power performance of AIGaN/GaN MODFETs with large gate periphery, as necessary for microwave power del;ices. is addressed in this paper. High-frequency large-signal characteristics of AIGaN/GaN MODFETs measured at 8 GHz are reported for devices with gatewidths from 200 mu m to 1 mm, 1-dB gain compression occurred at input power levels varying from -1 to +10 dBm as the gatewidth increased, while gain remained almost constant at similar to 17 dB, Output power density was similar to 1 W/mm for all devices and maximum output power (29.9 dBm) occurred in devices with I-mm gates, while power-added efficiency remained almost constant at similar to 30%. The large-signal characteristics were compared with those obtained by de and small-signal S-parameters measurements, The results illustrate a notable scalability of AICaN/GaN MODFET power characteristics and demonstrate their excellent potential for power applications.
引用
收藏
页码:1694 / 1700
页数:7
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