Study of inversion domain pyramids formed during the GaN:Mg growth

被引:7
作者
Martínez-Criado, G
Cros, A
Cantarero, A
Joshi, NV
Ambacher, O
Stutzmann, M
机构
[1] Univ Valencia, Dept Appl Phys, E-46100 Burjassot, Spain
[2] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
关键词
inversion domain; stacking fault; polarity;
D O I
10.1016/S0038-1101(02)00414-8
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The study of structural defects induced by the introduction of Mg during the growth of MOCVD GaN is presented. The magnesium incorporation into the crystal growth not only induces changes in the stacking sequence from hexagonal to cubic structures, but also inverts the GaN polarity from Ga-face to N-face. Based on the different surface structure and surface migration length of absorbing precursors for each polarity type (Ga- or N-face), the 3D growth on top of the N-face triangular defect is described. The N-face material is characterized by three dangling bonds of nitrogen that point Lip toward the c-plane surface, enhancing the crystal growth along the c-axis. (C) 2002 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:565 / 568
页数:4
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