A stochastic wire-length distribution for gigascale integration (GSI) - Part I: Derivation and validation

被引：216

作者：

Davis, JA

De, VK

Meindl, JD

机构：

[1] Microelectronics Research Center, School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta

来源：

IEEE TRANSACTIONS ON ELECTRON DEVICES | 1998年 / 45卷 / 03期

关键词：

interconnect density function; interconnect projections; Rent's Rule; stochastic system modeling; wire-length distribution;

D O I：

10.1109/16.661219

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Based on Rent's Rule, a well-established empirical relationship, a rigorous derivation of a complete wire-length distribution for on-chip random logic networks is performed, This distribution is compared to actual wife-length distributions for modern microprocessors, and a methodology to calculate the wire-length distribution for future gigascale integration (GSI) products is proposed.

引用

页码：580 / 589

页数：10

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