Low-temperature fabrication of Si thin-film transistor microstructures by soft lithographic patterning on curved and planar substrates

被引:20
作者
Erhardt, MK
Jin, HC
Abelson, JR
Nuzzo, RG [1 ]
机构
[1] Univ Illinois, Dept Chem, Urbana, IL 61801 USA
[2] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
[3] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL 61801 USA
关键词
D O I
10.1021/cm000480t
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
We demonstrate the use of micrometer-scale polymer molding, a soft-lithographic patterning technique, as a means to fabricate amorphous silicon thin-film transistors (TFTs). Two different TFT architectures were fabricated and tested-a common gate, common channel architecture for single-level patterning on a spherically curved glass substrate-and an isolated channel, inverted, staggered architecture with multilevel pattern registration on a planar glass substrate. The silicon and silicon nitride films are deposited by reactive magnetron sputtering, allowing all film depositions to be carried out at temperatures at or below 125 degreesC, and making this fabrication process a candidate for use on plastic or other thermally sensitive substrates. We discuss the performance of polymer molding as a patterning technique for thin-film microstructures on both planar substrates and on substrates with three-dimensional curvature.
引用
收藏
页码:3306 / 3315
页数:10
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