Small-angle X-ray scattering using coherent undulator radiation at the ESRF

被引:105
作者
Abernathy, DL
Grubel, G
Brauer, S
McNulty, I
Stephenson, GA
Mochrie, SGJ
Sandy, AR
Mulders, N
Sutton, M
机构
[1] European Synchrotron Radiat Facil, F-38043 Grenoble, France
[2] MIT, Cambridge, MA 02139 USA
[3] Argonne Natl Lab, Argonne, IL 60439 USA
[4] Univ Delaware, Newark, DE 19716 USA
[5] McGill Univ, Montreal, PQ H3A 2T8, Canada
来源
JOURNAL OF SYNCHROTRON RADIATION | 1998年 / 5卷
关键词
coherent X-rays; speckle; intensity fluctuation spectroscopy;
D O I
10.1107/S0909049597015835
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A simple approach for producing a high-coherent-flux X-ray beam for small-angle-scattering studies used at the Troika beamline of the European Synchrotron Radiation Facility is reported. For such small-angle studies it is permissible to reduce the longitudinal coherence length of the beam, thus increasing the energy bandpass and intensity of the beam, because there is only a small optical pathlength difference. By using mirrors and filters to cut unwanted energies from the undulator harmonic structure, a high-flux beam of >10(9) photons s(-1) through a 5 mu m-diameter pinhole at 8.2 keV with a bandpass of 1.3% can be produced. The coherent properties of this beam have been measured by analyzing a static speckle pattern from an aerogel sample imaged by a directly illuminated CCD camera. The speckle size and contrast are compared with the expected values based on a statistical analysis of the intensity distribution of speckle patterns obtained using partially coherent conditions. The expected widths of the spatial autocorrelation are found, but there is an apparent incoherent fraction of the beam which reduces the measured contrast. The method presented is to be used as a tool to optimize conditions for diffraction experiments using coherent X-rays.
引用
收藏
页码:37 / 47
页数:11
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