Strain-induced self-organized growth of nanostructures: From step bunching to ordering in quantum dot superlattices

被引:19
作者
Stangl, J
Roch, T
Holy, V
Pinczolits, M
Springholz, G
Bauer, G
Kegel, I
Metzger, TH
Zhu, J
Brunner, K
Abstreiter, G
Smilgies, D
机构
[1] Johannes Kepler Univ Linz, Inst Halbleiterphys, A-4040 Linz, Austria
[2] Univ Munich, Sekt Phys, D-880539 Munich, Germany
[3] Tech Univ Munich, Walter Schottky Inst, D-85748 Garching, Germany
[4] European Synchrotron Radiat Facil, F-38042 Grenoble, France
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2000年 / 18卷 / 04期
关键词
D O I
10.1116/1.1303736
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have investigated the lateral ordering of dot positions in a SiGe/Si multilayer and, for comparison, in a PbSe/PbEuTe dot superlattice using grazing incidence small-angle scattering. The two samples represent two different approaches to achieve an enhanced ordering of dot positions in semiconductor heterostructures: in the SiGe/Si sample, step bunching in the multilayer grown on a vicinal Si substrate was exploited to reduce the fluctuations in lateral dot distances. In the PbSe/PbEuTe sample the strong elastic anisotropy leads to the formation of a three-dimensional dot "lattice," exhibiting a very narrow distribution of dot distances. (C) 2000 American Vacuum Society. [S0734-211X(00)00404-2].
引用
收藏
页码:2187 / 2192
页数:6
相关论文
共 21 条
[1]   Semiconductor clusters, nanocrystals, and quantum dots [J].
Alivisatos, AP .
SCIENCE, 1996, 271 (5251) :933-937
[2]  
Bimberg D., 1999, QUANTUM DOT HETEROST
[3]   High-resolution x-ray diffraction from multilayered self-assembled Ge dots [J].
Darhuber, AA ;
Schittenhelm, P ;
Holy, V ;
Stangl, J ;
Bauer, G ;
Abstreiter, G .
PHYSICAL REVIEW B, 1997, 55 (23) :15652-15663
[4]   ANISOTROPIC ROUGHNESS IN GE/SI SUPERLATTICES [J].
HEADRICK, RL ;
BARIBEAU, JM ;
STRAUSSER, YE .
APPLIED PHYSICS LETTERS, 1995, 66 (01) :96-98
[5]   Oblique roughness replication in strained SiGe/Si multilayers [J].
Holy, V ;
Darhuber, AA ;
Stangl, J ;
Bauer, G ;
Nutzel, J ;
Abstreiter, G .
PHYSICAL REVIEW B, 1998, 57 (19) :12435-12442
[6]   Coplanar and grazing incidence x-ray-diffraction investigation of self-organized SiGe quantum dot multilayers [J].
Holy, V ;
Darhuber, AA ;
Stangl, J ;
Zerlauth, S ;
Schaffler, F ;
Bauer, G ;
Darowski, N ;
Lubbert, D ;
Pietsch, U ;
Vavra, I .
PHYSICAL REVIEW B, 1998, 58 (12) :7934-7943
[7]   Strain induced vertical and lateral correlations in quantum dot superlattices [J].
Holy, V ;
Springholz, G ;
Pinczolits, M ;
Bauer, G .
PHYSICAL REVIEW LETTERS, 1999, 83 (02) :356-359
[8]   Vertical alignment of multilayered quantum dots studied by x-ray grazing-incidence diffraction [J].
Kegel, I ;
Metzger, TH ;
Peisl, J ;
Stangl, J ;
Bauer, G ;
Smilgies, D .
PHYSICAL REVIEW B, 1999, 60 (04) :2516-2521
[9]   Lateral ordering of coherent Ge islands on Si(001) studied by triple-crystal grazing incidence diffraction [J].
Kegel, I ;
Metzger, TH ;
Peisl, J ;
Schittenhelm, P ;
Abstreiter, G .
APPLIED PHYSICS LETTERS, 1999, 74 (20) :2978-2980
[10]   Self-organized replication of 3D coherent island size and shape in multilayer heteroepitaxial films [J].
Liu, F ;
Davenport, SE ;
Evans, HM ;
Lagally, MG .
PHYSICAL REVIEW LETTERS, 1999, 82 (12) :2528-2531