Low temperature photoluminescence spectroscopy of thin film, polycrystalline CdTe/CdS solar cell structures

被引:11
作者
Bridge, CJ
Dawson, P
Buckle, PD
Özsan, ME
机构
[1] Univ Manchester, Inst Sci & Technol, Dept Phys, Manchester M60 1QD, Lancs, England
[2] BP Solar, Sunbury on Thames TW16 7DX, England
关键词
D O I
10.1088/0268-1242/15/10/308
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
As-grown n-CdTe/n-CdS solar cell structures deposited on tin oxide-coated glass have been studied using low temperature photoluminescence spectroscopy. The structures were annealed in air at temperatures up to 600 degreesC. For anneal temperatures of 400-450 degreesC, and above, acceptor related transitions at around 1.45, 1.51 and 1.56 eV are tentatively ascribed to copper, oxygen and V-Cd-related centres, respectively. Illuminated current-voltage measurements have shown that these findings are consistent with considerable improvements in short circuit current density that are believed to be associated with n- to p-type conversion of the CdTe film.
引用
收藏
页码:975 / 979
页数:5
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