Interferometric phase-dispersion microscopy

被引：57

作者：

Yang, CH ^{[1
]}

Wax, A

Georgakoudi, I

Hanlon, EB

Badizadegan, K

Dasari, RR

Feld, MS

机构：

[1] MIT, George R Harrison Spect Lab, Cambridge, MA 02139 USA

[2] Childrens Hosp, Dept Pathol, Boston, MA 02115 USA

来源：

OPTICS LETTERS | 2000年 / 25卷 / 20期

关键词：

D O I：

10.1364/OL.25.001526

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe a new scanning microscopy technique, phase-dispersion microscopy (PDM). The technique is based on measuring the phase difference between the fundamental and the second-harmonic light in a novel interferometer. PDM is highly sensitive to subtle refractive-index differences that are due to dispersion (differential optical path sensitivity, 5 nm). We apply PDM to measure minute amounts of DNA in solution and to study biological tissue sections. We demonstrate that PDM performs better than conventional phase-contrast microscopy in imaging dispersive and weakly scattering samples. (C) 2000 Optical Society of America OCIS codes: 040.2840, 110.0180, 110.4500, 120.5050, 170.3880.

引用

页码：1526 / 1528

页数：3

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