Comment on "Electrostatic force microscopy on oriented graphite surfaces: Coexistence of insulating and conducting behaviors" - Reply

被引：8

作者：

Lu, Yonghua

Munoz, M.

Steplecaru, C. S.

Hao, Cheng

Bai, Ming

Garcia, N.

Schindler, K.

Spoddig, D.

Esquinazi, P.

机构：

[1] CSIC, Lab Fis Sistemas Pequenos & Nanotecnol, Madrid 28006, Spain

[2] Univ Leipzig, Div SUM, D-04103 Leipzig, Germany

来源：

PHYSICAL REVIEW LETTERS | 2007年 / 98卷 / 26期

关键词：

D O I：

10.1103/PhysRevLett.98.269702

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页数：1

共 7 条

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Munoz, M. ;

Steplecaru, C. S. ;

Hao, Cheng ;

Bai, Ming ;

Garcia, N. ;

Schindler, K. ;

Esquinazi, P. .

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[6] Comment on "Electrostatic force microscopy on oriented graphite surfaces: Coexistence of insulating and conducting behaviors" [J].

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