AlGaN/GaN heterostructure field-effect transistors on single-crystal bulk AlN

被引:73
作者
Hu, X [1 ]
Deng, J
Pala, N
Gaska, R
Shur, MS
Chen, CQ
Yang, J
Simin, G
Khan, MA
Rojo, JC
Schowalter, LJ
机构
[1] Sensor Elect Technol Inc, Columbia, SC 29209 USA
[2] Rensselaer Polytech Inst, Broadband Ctr, Troy, NY 12180 USA
[3] Rensselaer Polytech Inst, ECSE, Troy, NY 12180 USA
[4] Univ S Carolina, Columbia, SC 29208 USA
[5] Crystal IS Inc, Latham, NY 12110 USA
关键词
D O I
10.1063/1.1555282
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on the performance of AlGaN/GaN/AlN heterostructure field-effect transistors (HFETs) grown over slightly-off c-axis, single-crystal, bulk AlN substrates. Dc and rf characteristics of these devices were comparable to HFETs grown on semi-insulating SiC. The obtained results demonstrate that bulk AlN substrates are suitable for fabricating high-power microwave AlGaN/GaN transistors. (C) 2003 American Institute of Physics.
引用
收藏
页码:1299 / 1301
页数:3
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