Semiconductor wafer bonding via liquid capillarity

被引:184
作者
Liau, ZL [1 ]
机构
[1] MIT, Lincoln Lab, Lexington, MA 02420 USA
关键词
D O I
10.1063/1.127074
中图分类号
O59 [应用物理学];
学科分类号
摘要
Liquid surface tension has been used to pull different semiconductor wafers to very close contact and strong bonding. Bonded wafers, such as GaAs/GaP, were heat treated without pressure application to achieve wafer fusion. The bonding process has been analyzed, and criteria for surface tension, wafer flatness, and elasticity have been derived. (C) 2000 American Institute of Physics. [S0003-6951(00)03031-X].
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页码:651 / 653
页数:3
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