BUBBLE-FREE WAFER BONDING OF GAAS AND INP ON SILICON IN A MICROCLEANROOM

被引:45
作者
LEHMANN, V
MITANI, K
STENGL, R
MII, T
GOSELE, U
机构
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1989年 / 28卷 / 12期
关键词
D O I
10.1143/JJAP.28.L2141
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:L2141 / L2143
页数:3
相关论文
共 10 条
[1]  
FAN JCC, 1987, HETEROEPITAXY SILICO, V2
[2]   DOUBLE-CANTILEVER CLEAVAGE MODE OF CRACK PROPAGATION [J].
GILLIS, PP ;
GILMAN, JJ .
JOURNAL OF APPLIED PHYSICS, 1964, 35 (3P1) :647-&
[3]   HIGH-QUALITY SOI BY BONDING OF STANDARD SI WAFERS AND THINNING BY POLISHING TECHNIQUES ONLY [J].
HAISMA, J ;
MICHIELSEN, TM ;
SPIERINGS, GACM .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (05) :L725-L726
[4]  
HAISMA J, IN PRESS JPN J APPL
[5]   CHARACTERIZATION OF THIN ALGAAS/INGAAS/GAAS QUANTUM-WELL STRUCTURES BONDED DIRECTLY TO SIO2/SI AND GLASS SUBSTRATES [J].
KLEM, JF ;
JONES, ED ;
MYERS, DR ;
LOTT, JA .
JOURNAL OF APPLIED PHYSICS, 1989, 66 (01) :459-462
[6]   BONDING OF SILICON-WAFERS FOR SILICON-ON-INSULATOR [J].
MASZARA, WP ;
GOETZ, G ;
CAVIGLIA, A ;
MCKITTERICK, JB .
JOURNAL OF APPLIED PHYSICS, 1988, 64 (10) :4943-4950
[7]   A MODEL FOR THE SILICON-WAFER BONDING PROCESS [J].
STENGL, R ;
TAN, T ;
GOSELE, U .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1989, 28 (10) :1735-1741
[8]   BUBBLE-FREE SILICON-WAFER BONDING IN A NON-CLEANROOM ENVIRONMENT [J].
STENGL, R ;
AHN, KY ;
GOSELE, U .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1988, 27 (12) :L2364-L2366
[9]  
STENGL R, 1989 P IEEE SOS SOI, P123
[10]   EPITAXIAL LATERAL OVERGROWTH OF GAAS ON A SI SUBSTRATE [J].
UJIIE, Y ;
NISHINAGA, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1989, 28 (03) :L337-L339