Low-light divergence in photovoltaic parameter fluctuations

被引：9

作者：

Shvydka, D ^{[1
]}

Karpov, VG ^{[1
]}

Compaan, AD ^{[1
]}

机构：

[1] Univ Toledo, Dept Phys & Astron, Toledo, OH 43606 USA

来源：

APPLIED PHYSICS LETTERS | 2003年 / 82卷 / 13期

关键词：

D O I：

10.1063/1.1563836

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We study statistics of the major photovoltaic (PV) parameters, such as open-circuit voltage, short-circuit current, etc., versus light intensity on a set of nominally identical thin-film CdTe/CdS solar cells. A crossover light intensity is found, below which the relative fluctuations of the PV parameters diverge inversely proportional to the square root of the light intensity. We propose a model in which the observed fluctuations are due to lateral nonuniformities in the device structure. The crossover is attributed to the lateral nonuniformity screening length exceeding the device size. From the practical standpoint, our study introduces a simple uniformity diagnostic technique. (C) 2003 American Institute of Physics.

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页码：2157 / 2159

页数：3

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