Atomic layer epitaxy

被引:69
作者
Niinisto, L [1 ]
机构
[1] Helsinki Univ Technol, Inorgan & Analyt Chem Lab, FIN-02015 Espoo, Finland
关键词
D O I
10.1016/S1359-0286(98)80080-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Atomic layer epitaxy is now a mature technique offering, through its self-limiting character, distinct advantages for materials processing especially when precise layer thickness control or conformal coating is needed. The technique is well suited for binary compounds and their doping but it is also applicable to more complex thin film structures. With a broadening range of materials processed by atomic layer epitaxy, new applications are emerging in electronics, optics and catalysis.
引用
收藏
页码:147 / 152
页数:6
相关论文
共 63 条
  • [1] Atomic-layer growth of TiO2-II thin films
    Aarik, J
    Aidla, A
    Uustare, T
    [J]. PHILOSOPHICAL MAGAZINE LETTERS, 1996, 73 (03) : 115 - 119
  • [2] Effect of growth conditions on formation of TiO2-II thin films in atomic layer deposition process
    Aarik, J
    Aidla, A
    Sammelselg, V
    Uustare, T
    [J]. JOURNAL OF CRYSTAL GROWTH, 1997, 181 (03) : 259 - 264
  • [3] ABERNATHY CR, 1996, EMIS DATAREV SER, V16, P663
  • [4] Evaluation of thin Si films grown on Ge(100) by synchrotron-radiation-excited atomic layer epitaxy and chemical vapor deposition from Si2H6
    Akazawa, H
    [J]. JOURNAL OF CRYSTAL GROWTH, 1997, 173 (3-4) : 343 - 351
  • [5] Ares R, 1996, CAN J PHYS, V74, pS85
  • [6] Optical approaches to determine near-surface compositions during epitaxy
    Aspnes, DE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, 1996, 14 (03): : 960 - 966
  • [7] Molecular layer epitaxy by real-time optical process monitoring
    Bachmann, KJ
    Hopfner, C
    Sukidi, N
    Miller, AE
    Harris, C
    Aspnes, DE
    Dietz, NA
    Tran, HT
    Beeler, S
    Ito, K
    Banks, HT
    Rossow, U
    [J]. APPLIED SURFACE SCIENCE, 1997, 112 : 38 - 47
  • [8] Bedair S.M., 1994, ENCY ADV MAT, V1, P141
  • [9] Surface models for the adsorption of a calcium beta-diketonate complex on calcium sulfide
    Calhorda, MJ
    Veiros, LF
    Niinisto, L
    [J]. ACTA CHEMICA SCANDINAVICA, 1996, 50 (10): : 862 - 870
  • [10] Deposition of tin oxide into porous silicon by atomic layer epitaxy
    Ducso, C
    Khanh, NQ
    Horvath, Z
    Barsony, I
    Utriainen, M
    Lehto, S
    Nieminen, M
    Niinisto, L
    [J]. JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1996, 143 (02) : 683 - 687