A comparative schlieren imaging study between ns and sub-ps laser forward transfer of Cr

被引:41
作者
Zergioti, I
Papazoglou, DG
Karaiskou, A
Fotakis, C
Gamaly, E
Rode, A
机构
[1] Fdn Res & Technol Hellas, Inst Elect Struct & Laser, Iraklion 71110, Greece
[2] Australian Natl Univ, Res Sch Phys Sci & Engn, Canberra, ACT 0200, Australia
关键词
chromium; laser microprinting; schlieren imaging;
D O I
10.1016/S0169-4332(02)01363-6
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A comparative study of the effect of ultrashort (0.5 ps) and short (30 ns) pulses on the laser forward transfer of Cr is presented in this paper. The dynamics of the process was investigated by stroboscopic schlieren imaging for time delays up to 3 mus following the laser irradiation pulse. In contrast to the ns laser, the directionality of the ejected material is very high in the case of the sub-ps laser process. The narrow angular divergence (3degrees) of the sub-ps pulses permits the direct dynamic transfer of the material and opens up new application possibilities for the fabrication of high spatial resolution microstructures. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:177 / 180
页数:4
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