Micro-structure transformation of silicon: A newly developed transformation technology for patterning silicon surfaces using the surface migration of silicon atoms by hydrogen annealing

被引:69
作者
Sato, T [1 ]
Mitsutake, K [1 ]
Mizushima, I [1 ]
Tsunashima, Y [1 ]
机构
[1] Toshiba Co Ltd, Semicond Co, Proc & Mfg Engn Ctr, Isogo Ku, Yokohama, Kanagawa 2358522, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2000年 / 39卷 / 9A期
关键词
silicon surface migration; hydrogen anneal; transformation; void;
D O I
10.1143/JJAP.39.5033
中图分类号
O59 [应用物理学];
学科分类号
摘要
The micro-structure transformation of silicon (MSTS), which is a transformation technology for patterning silicon surfaces by hydrogen annealing, is presented for the first time. The transformation was controlled by the parameters of annealing pressure as well as annealing time and temperature. Voids of sub-micrometer regime size can be intentionally formed in the silicon substrates by making use of transformation. Electrical characteristics, such as the reliability of the thin dielectrics formed in the deep trenches, were improved with the aid of the MSTS process, due to the flattening of the inside surface of the trenches and the rounding of the corners. The mechanism of the transformation by MSTS was studied by means of molecular dynamics, which clearly shows the migration of silicon atoms on the surface. MSTS is a promising technology for the fabrication of future integrated circuits in silicon.
引用
收藏
页码:5033 / 5038
页数:6
相关论文
共 13 条
[1]   NONLINEAR STABILITY ANALYSIS OF THE DIFFUSIONAL SPHEROIDIZATION OF RODS [J].
CHOY, JH ;
HACKNEY, SA ;
LEE, JK .
JOURNAL OF APPLIED PHYSICS, 1995, 77 (11) :5647-5654
[2]  
HEGDE RI, 1996, J VAC SCI TECHNOL B, V14, P3229
[3]   Ultra-large-scale step-free terraces formed at the bottom of craters on vicinal Si(III) surfaces [J].
Homma, Y ;
Aizawa, N ;
Ogino, T .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (2B) :L241-L243
[4]   SURFACE SELF-DIFFUSION ON SI FROM THE EVOLUTION OF PERIODIC ATOMIC STEP ARRAYS [J].
KEEFFE, ME ;
UMBACH, CC ;
BLAKELY, JM .
JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1994, 55 (10) :965-973
[5]   Novel corner rounding process for Shallow Trench Isolation utilizing MSTS (Micro-Structure Transformation of Silicon) [J].
Matsuda, S ;
Sato, T ;
Yoshimura, H ;
Takegawa, Y ;
Sudo, A ;
Mizushima, I ;
Tsunashima, Y ;
Toyoshima, Y .
INTERNATIONAL ELECTRON DEVICES MEETING 1998 - TECHNICAL DIGEST, 1998, :137-140
[6]  
NICHOLS FA, 1965, T METALL SOC AIME, V233, P1840
[7]   A UNIFIED FORMULATION OF THE CONSTANT TEMPERATURE MOLECULAR-DYNAMICS METHODS [J].
NOSE, S .
JOURNAL OF CHEMICAL PHYSICS, 1984, 81 (01) :511-519
[8]   Step arrangement design and nanostructure self-organization on Si surfaces [J].
Ogino, T ;
Hibino, H ;
Homma, Y .
APPLIED SURFACE SCIENCE, 1997, 117 :642-651
[9]   Dominant factor for the concentration of phosphorus introduced by vapor phase doping (VPD) [J].
Sato, T ;
Mizushima, I ;
Aoki, N ;
Tsunashima, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1998, 37 (3B) :1162-1165
[10]   3-DIMENSIONAL ANALYSIS OF SUBTHRESHOLD SWING AND TRANSCONDUCTANCE FOR FULLY RECESSED OXIDE (TRENCH) ISOLATED 1/4-MU-M-WIDTH MOSFETS [J].
SHIGYO, N ;
FUKUDA, S ;
WADA, T ;
HIEDA, K ;
HAMAMOTO, T ;
WATANABE, H ;
SUNOUCHI, K ;
TANGO, H .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1988, 35 (07) :945-951