A simplified approach to time-domain modeling of avalanche photodiodes

被引:56
作者
Bandyopadhyay, A [1 ]
Deen, MJ
Tarof, LE
Clark, W
机构
[1] Oregon State Univ, Dept Elect & Comp Engn, Corvallis, OR 97331 USA
[2] Simon Fraser Univ, Sch Engn Sci, Burnaby, BC V5A 1S6, Canada
[3] Nortel, Ottawa, ON K1Y 4H7, Canada
关键词
avalanche photodiodes; optoelectronic devices; photodetectors; photodiodes; time-domain analysis;
D O I
10.1109/3.663452
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A simplified algorithm for calculating time response of avalanche photodiodes (APD's) is presented, The algorithm considers the time course of avalanche processes for the general case of position-dependent double-carrier multiplications including the dead space effect, The algorithm is based on a discrete time setting ideally suited for computer modeling and can be applied to any APD structure. It gives a fast and accurate estimation of the time and frequency response of APD's, As an example, the present method is applied to InP-InGaAs separate absorption, grading, charge, and multiplication (SAGCM) APD's, The variation of multiplication gain with bias voltage and 3-dB electrical bandwidth at different multiplication gain obtained using the new algorithm show good agreement with experimental results, The algorithm can be used to study temperature dependence of APD characteristics and can he easily extended to calculate the excess noise factor.
引用
收藏
页码:691 / 699
页数:9
相关论文
共 31 条
[1]   DISTRIBUTION FUNCTIONS AND IONIZATION RATES FOR HOT ELECTRONS IN SEMICONDUCTORS [J].
BARAFF, GA .
PHYSICAL REVIEW, 1962, 128 (06) :2507-&
[2]   FREQUENCY-RESPONSE OF INP/INGAASP/INGAAS AVALANCHE PHOTODIODES [J].
CAMPBELL, JC ;
JOHNSON, BC ;
QUA, GJ ;
TSANG, WT .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1989, 7 (05) :778-784
[3]   FREQUENCY-RESPONSE OF INP/INGAASP/INGAAS AVALANCHE PHOTODIODES WITH SEPARATE ABSORPTION GRADING AND MULTIPLICATION REGIONS [J].
CAMPBELL, JC ;
HOLDEN, WS ;
QUA, GJ ;
DENTAI, AG .
IEEE JOURNAL OF QUANTUM ELECTRONICS, 1985, 21 (11) :1743-1746
[4]   A PHYSICS-BASED FITTING AND EXTRAPOLATION METHOD FOR MEASURED IMPACT IONIZATION COEFFICIENTS IN III-V-SEMICONDUCTORS [J].
CHAU, HF ;
PAVLIDIS, D .
JOURNAL OF APPLIED PHYSICS, 1992, 72 (02) :531-538
[5]   TEMPERATURE DEPENDENCE OF AVALANCHE MULTIPLICATION IN SEMICONDUCTORS [J].
CROWELL, CR ;
SZE, SM .
APPLIED PHYSICS LETTERS, 1966, 9 (06) :242-&
[6]   AVALANCHE-PHOTODIODE FREQUENCY RESPONSE [J].
EMMONS, RB .
JOURNAL OF APPLIED PHYSICS, 1967, 38 (09) :3705-+
[7]   ANALYSIS OF THE DARK CURRENT AND PHOTORESPONSE OF IN0.53GA0.47AS/INP AVALANCHE PHOTO-DIODES [J].
FORREST, SR ;
KIM, OK ;
SMITH, RG .
SOLID-STATE ELECTRONICS, 1983, 26 (10) :951-968
[8]   EFFECT OF DEAD SPACE ON GAIN AND NOISE OF DOUBLE-CARRIER-MULTIPLICATION AVALANCHE PHOTODIODES [J].
HAYAT, MM ;
SALEH, BEA ;
TEICH, MC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1992, 39 (03) :546-552
[9]   BIT-ERROR RATES FOR OPTICAL RECEIVERS USING AVALANCHE PHOTODIODES WITH DEAD SPACE [J].
HAYAT, MM ;
SALEH, BEA ;
GUBNER, JA .
IEEE TRANSACTIONS ON COMMUNICATIONS, 1995, 43 (01) :99-106
[10]   STATISTICAL PROPERTIES OF THE IMPULSE-RESPONSE FUNCTION OF DOUBLE-CARRIER MULTIPLICATION AVALANCHE PHOTODIODES INCLUDING THE EFFECT OF DEAD SPACE [J].
HAYAT, MM ;
SALEH, BEA .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 1992, 10 (10) :1415-1425