Characterization of ITO/CuPc/AI and ITO/ZnPc/Al structures using optical and capacitance spectroscopy

被引:48
作者
Reis, FT
Mencaraglia, D
Saad, SO
Séguy, I
Oukachmih, M
Jolinat, P
Destruel, P
机构
[1] Univ Paris 06, Ecole Super Elect, CNRS, UMR 8507,Lab Genie Elect Paris, F-91192 Gif Sur Yvette, France
[2] Univ Paris 11, Ecole Super Elect, CNRS, UMR 8507,Lab Genie Elect Paris, F-91192 Gif Sur Yvette, France
[3] Univ Toulouse 3, CNRS, UMR 5003, Lab Genie Elect Toulouse, F-31062 Toulouse, France
关键词
admittance spectroscopy; metal-substituted phthalocyanine; optoelectronic properties;
D O I
10.1016/S0379-6779(02)01284-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Metal-substituted phthalocyanine (MPc) thin films as zinc- or copper-phthalocyanine are often used as charge injection layers for organic electroluminescent or photovoltaic devices. It is then important to characterize their electronic defect density and band structure near their gap. In this work the monolayer structures were prepared by vacuum sublimation of the organic thin film sandwiched between indium tin oxide (ITO) and aluminum electrodes. Electrically active defects were investigated with space-charge capacitance spectroscopy, as a function of temperature and frequency, in the range 80-330 K and 40 Hz to 10 MHz, respectively. Organic materials are best described on the basis of individual molecular orbital (HOMO and LUMO) energies instead of valence and conduction band. Such energies were derived from cyclic voltammetry and optical absorption spectroscopy measurements. Experimental results were correlated to the electrical J-V characteristics of these MPc based devices to gain more insight on the charge injection processes and their limitations. (C) 2003 Elsevier Science B.V. All tights reserved.
引用
收藏
页码:33 / 37
页数:5
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