Application of the Convergent Beam Imaging (CBIM) technique to the analysis of crystal defects

被引：3

作者：

Morniroli, JP ^{[1
]}

Cordier, P

Van Cappellen, E

Zuo, JM

Spence, J

机构：

[1] Univ Lille 1, LSPES, CNRS, URA 234, F-59655 Villeneuve Dascq, France

[2] Philips Electron Opt BV, NL-5600 MD Eindhoven, Netherlands

[3] Arizona State Univ, Dept Phys, Tempe, AZ 85287 USA

来源：

MICROSCOPY MICROANALYSIS MICROSTRUCTURES | 1997年 / 8卷 / 03期

关键词：

D O I：

10.1051/mmm:1997114

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

It is shown how the technique of Convergent Beam IMaging (CBIM), proposed by Humpreys et al. in 1988, can be useful for the analysis of crystal defects such as dislocations in Garnet. It is also shown how the original technique can be greatly improved by using an objective aperture, a very small spot size and an energy filter. With these experimental conditions, the quality of the CBIM patterns is nearly as good as the quality of LACBED patterns, with which they are compared.

引用

页码：187 / 202

页数：16

共 16 条

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