Influence of volume and surface properties on phase contrast in tapping mode atomic force microscopy

被引:15
作者
Berquand, A
Mazeran, PE
Laval, JM
机构
[1] Univ Technol Compiegne, Lab Roberval, Unite Rech Mecan, CNRS,UMR 6066, F-60205 Compiegne, France
[2] Univ Technol Compiegne, CNRS, UMR 6022, F-60205 Compiegne, France
关键词
atomic force microscopy; surface structure; morphology; roughness; and topography; energy dissipation;
D O I
10.1016/S0039-6028(02)02455-X
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Phase imaging angle of the cantilever oscillation in tapping mode scanning force microscopy can be related to the energy dissipated per oscillation. Nevertheless, in many cases, the physical properties (adhesion, viscosity...) of the sample that are sources of this energy dissipation are not clearly identified. We propose a simple method to distinguish the influence of surface and volume properties on phase imaging. This method is based on equalizing of surface properties by covering the sample surface with thin gold layers. As an example, in our specific working conditions (moderate tapping on glass-polyester composite), we show that volume properties have an important influence on the phase signal in comparison to surface properties. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:125 / 130
页数:6
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