Measurement of interface potential change and space charge region across metal/organic/metal structures using Kelvin probe force microscopy

被引：18

作者：

Tal, O

Gao, W

Chan, CK

Kahn, A

Rosenwaks, Y ^{[1
]}

机构：

[1] Tel Aviv Univ, Fac Engn, Dept Phys Elect, IL-69978 Tel Aviv, Israel

[2] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 18期

关键词：

D O I：

10.1063/1.1811805

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We report on high-resolution potential measurements across complete metal/organic molecular semiconductor/metal structures using Kelvin probe force microscopy in inert atmosphere. It is found that the potential distribution at the metal/organic interfaces is in agreement with an interfacial abrupt potential changes and the work function of the different metals. The potential distribution across the organic layer strongly depends on its purification. In pure Alq(3) the potential profile is flat, while in nonpurified layers there is substantial potential bending probably due to the presence of deep traps. The effect of the measuring tip is calculated and discussed. (C) 2004 American Institute of Physics.

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页码：4148 / 4150

页数：3

相关论文

共 21 条

[1] Finite element simulations of the resolution in electrostatic force microscopy [J].

Belaidi, S ;

Lebon, F ;

Girard, P ;

Leveque, G ;

Pagano, S .

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1) :S239-S243

[2] Noncontact potentiometry of polymer field-effect transistors [J].

Bürgi, L ;

Sirringhaus, H ;

Friend, RH .

APPLIED PHYSICS LETTERS, 2002, 80 (16) :2913-2915

[3] Close look at charge carrier injection in polymer field-effect transistors [J].

Bürgi, L ;

Richards, TJ ;

Friend, RH ;

Sirringhaus, H .

JOURNAL OF APPLIED PHYSICS, 2003, 94 (09) :6129-6137

[4] ELECTROSTATICALLY DRIVEN APPARATUS FOR MEASURING WORK FUNCTION DIFFERENCES [J].

FAIN, SC ;

CORBIN, LV ;

MCDAVID, JM .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1976, 47 (03) :345-347

[5]

GROBMAN WD, 1979, PHOTOEMISSION SOLIDS, V2, P261

[6] ADSORPTION OF WATER ON GOLD-FILMS - A WORK FUNCTION AND THERMAL-DESORPTION MASS-SPECTROMETRY STUDY [J].

HERAS, JM ;

ALBANO, EV .

ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-WIESBADEN, 1982, 129 (01) :11-20

[7] Charge-separation energy in films of π-conjugated organic molecules [J].

Hill, IG ;

Kahn, A ;

Soos, ZG ;

Pascal, RA .

CHEMICAL PHYSICS LETTERS, 2000, 327 (3-4) :181-188

[8] ELECTROSTATIC FORCES BETWEEN METALLIC TIP AND SEMICONDUCTOR SURFACES [J].

HUDLET, S ;

SAINTJEAN, M ;

ROULET, B ;

BERGER, J ;

GUTHMANN, C .

JOURNAL OF APPLIED PHYSICS, 1995, 77 (07) :3308-3314

[9] Energy level alignment at organic/metal interfaces studied by UV photoemission: Breakdown of traditional assumption of a common vacuum level at the interface [J].

Ishii, H ;

Seki, K .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1997, 44 (08) :1295-1301

[10]

Ishii H, 1999, ADV MATER, V11, P605, DOI 10.1002/(SICI)1521-4095(199906)11:8<605::AID-ADMA605>3.0.CO