Giant piezoresistance and its origin in Si(111) nanowires: First-principles calculations

被引:65
作者
Cao, J. X. [1 ]
Gong, X. G.
Wu, R. Q.
机构
[1] Univ Calif Irvine, Dept Phys & Astron, Irvine, CA 92697 USA
[2] Xiangtan Univ, Dept Phys, Xiangtan 411105, Peoples R China
[3] Fudan Univ, Surface Sci Lab State Key, Shanghai 200433, Peoples R China
[4] Fudan Univ, Dept Phys, Shanghai 200433, Peoples R China
关键词
SILICON; GROWTH; NANOCRYSTALS;
D O I
10.1103/PhysRevB.75.233302
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Through systematic first-principles calculations, we found extraordinarily high piezoresistance coefficients in a pristine Si(111) nanowire. This stems from interplay between the presence of two surface states with different localizations and unusual surface relaxation. Lattice compression along the axis causes switch between light and heavy surface states and, subsequently, alters the effective masses of carriers. Fascinatingly, model calculations produced main features of experimental data [R. R. He and P. D. Yang, Nat. Nanotechnol. 1, 42 (2006)] despite much difference in wire sizes and surface conditions.
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页数:4
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