Fabrication and electrical properties of LaNiO3/Pb(Zr0.61Ti0.39)O3/LaNiO3/LaAlO3 all-perovskite heterostructures

被引：3

作者：

Zhang, ST

Tan, WS

Yuan, GL

Zhang, XJ

Cheng, HW

Chen, YF ^{[1
]}

Liu, ZG

Ming, NB

机构：

[1] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China

[2] Nanjing Univ, Dept Mat Sci & Engn, Nanjing 210093, Peoples R China

[3] Nanjing Univ, Natl Lab Solid State Microstruct, Nanjing 210093, Peoples R China

[4] Nanjing Univ, Dept Phys, Nanjing 210093, Peoples R China

来源：

MICROELECTRONIC ENGINEERING | 2003年 / 66卷 / 1-4期

关键词：

Pb(Zr; Ti)O-3; LaNiO3; heterostructure; AFM; XPS; hysteresis loop;

D O I：

10.1016/S0167-9317(02)00987-5

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

All-perovskite heterostructures of LaNiO3(LNO)/Pb(Zr0.61Ti0.39)O-3(PZT)/LNO were fabricated on (001)-LaAlO3. (LAO) single crystal substrates by pulsed laser deposition (PLD). The structures of both LNO/LAO and LNO/PZT/LNO/LAO were characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM). The Zr:Ti ratio and the surface oxygen ions of the PZT films were analyzed by X-ray photoelectron spectroscopy (XPS) in detail. The XPS peak corresponding to lattice oxygen ions showed obvious asymmetry, which indicated the different binding energy of Ti-O and Pb/Zr-O bonds. The PZT films showed a square hysteresis loop with remnant polarization (P-r) and saturated polarization (P-s) of 13.8 muC/cm(2) and 31.5 muC/cm(2), respectively. Good saturation property with the increase of applied electrical field was exhibited. (C) 2002 Elsevier Science B.V. All rights reserved.

引用

页码：701 / 707

页数：7

共 16 条

[1]

[Anonymous], 1979, HDB XPS

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