Giant tunnelling magnetoresistance at room temperature with MgO (100) tunnel barriers

被引:2627
作者
Parkin, SSP [1 ]
Kaiser, C [1 ]
Panchula, A [1 ]
Rice, PM [1 ]
Hughes, B [1 ]
Samant, M [1 ]
Yang, SH [1 ]
机构
[1] IBM Corp, Almaden Res Ctr, Div Res, IBM Infineon MRAM Dev Alliance, San Jose, CA 95120 USA
关键词
D O I
10.1038/nmat1256
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Magnetically engineered magnetic tunnel junctions (MTJs) show promise as non-volatile storage cells in high-performance solid-state magnetic random access memories (MRAM)1. The performance of these devices is currently limited by the modest (<∼70%) room-temperature tunnelling magnetoresistance (TMR) of technologically relevant MTJs. Much higher TMR values have been theoretically predicted for perfectly ordered (100) oriented single-crystalline Fe/MgO/Fe MTJs. Here we show that sputter-deposited polycrystalline MTJs grown on an amorphous underlayer, but with highly oriented (100) MgO tunnel barriers and CoFe electrodes, exhibit TMR values of up to ∼220% at room temperature and ∼300% at low temperatures. Consistent with these high TMR values, superconducting tunnelling spectroscopy experiments indicate that the tunnelling current has a very high spin polarization of ∼85%, which rivals that previously observed only using half-metallic ferromagnets2. Such high values of spin polarization and TMR in readily manufactureable and highly thermally stable devices (up to 400°C) will accelerate the development of new families of spintronic devices.
引用
收藏
页码:862 / 867
页数:6
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