Wide-angle antireflection effect of subwavelength structures for solar cells

被引:77
作者
Sai, Hitoshi
Fujii, Homare
Arafune, Koji
Ohshita, Yoshio
Kanamori, Yoshiaki
Yugami, Hiroo
Yamaguchi, Masafumi
机构
[1] Toyota Technol Inst, Nagoya, Aichi 4688511, Japan
[2] Tohoku Univ, Grad Sch Engn, Aoba Ku, Sendai, Miyagi 9808579, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 6A期
关键词
surface texture; subwavelength structure; solar cell; antireflection; angle dependence; light-trapping;
D O I
10.1143/JJAP.46.3333
中图分类号
O59 [应用物理学];
学科分类号
摘要
The angle-dependent reflectivity of several surface structures was analyzed and evaluated with the viewpoint of solar cell applications. Numerical analysis showed that a Si subwavelength structure (SWS) maintains a lower reflectivity at large incident angles than conventional light-trapping techniques such as a random pyramid texture, and that it can contribute to increasing the output power of solar cells under oblique irradiation. This wide-angle antireflection effect was demonstrated by fabricating test crystalline Si cells with several surface structures including a SWS and measuring their angle-dependent short-circuit current densities.
引用
收藏
页码:3333 / 3336
页数:4
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