Transmission electron microscopy and transistor characteristics of the same carbon nanotube

被引：25

作者：

Meyer, JC ^{[1
]}

Obergfell, D

Roth, S

Yang, SH

Yang, SF

机构：

[1] Max Planck Inst Solid State Res, Stuttgart, Germany

[2] Hong Kong Univ Sci & Technol, Dept Chem, Kowloon, Hong Kong, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2004年 / 85卷 / 14期

关键词：

D O I：

10.1063/1.1805701

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A technique is presented which allows one to combine TEM investigations with transport measurements and potentially a wide range of other investigations on the same nanoobject. Using this technique, we have obtained high-resolution transmission electron microscopy images and transport investigations including transfer characteristics on the same single-walled carbon nanotube. The transfer characteristics show ambipolar transport. This observation is discussed taking into account TEM information on tube diameter, number of tubes in the bundle, and possible tube filling with fullerenes (peapods). (C) 2004 American Institute of Physics.

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页码：2911 / 2913

页数：3

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