Exceptionally high voltage Schottky diamond diodes and low boron doping

被引:166
作者
Butler, JE
Geis, MW
Krohn, KE
Lawless, J
Deneault, S
Lyszczarz, TM
Flechtner, D
Wright, R
机构
[1] USN, Res Lab, Div Chem, Washington, DC 20375 USA
[2] MIT, Lincoln Lab, Lexington, MA 02420 USA
[3] Diamond Microelect Corp, Santa Monica, CA 90402 USA
关键词
D O I
10.1088/0268-1242/18/3/309
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Exceptionally pure epitaxial diamond layers have been grown by microwave plasma chemical vapour deposition, which have low boron doping, from 5 x 10(14) to 1 x 10(16) cm(-3), and the compensating n-type impurities are the lowest reported for any semiconducting diamond, <3 x 10(13) cm(-3). The hydrogen impurities that bind with the boron making them electrically inactive can be significantly reduced by baking the diamond to >700 degreesC for similar to1 s in air. Schottky diodes made on these epitaxial diamond films have breakdown voltages >6 kV, twelve times the highest breakdown voltage reported for any diamond diode and higher than any other semiconductor Schottky diode.
引用
收藏
页码:S67 / S71
页数:5
相关论文
共 22 条
[21]   Low-compensated boron-doped homoepitaxial diamond films [J].
Yamanaka, S ;
Takeuchi, D ;
Watanabe, H ;
Okushi, H ;
Kajimura, K .
DIAMOND AND RELATED MATERIALS, 2000, 9 (3-6) :956-959
[22]   Passivation of boron in diamond by deuterium [J].
Zeisel, R ;
Nebel, CE ;
Stutzmann, M .
APPLIED PHYSICS LETTERS, 1999, 74 (13) :1875-1876