Optical interconnects for future high performance integrated circuits

被引:20
作者
Kapur, P [1 ]
Saraswat, KC [1 ]
机构
[1] Stanford Univ, Ctr Integrated Syst, Dept Elect Engn, Stanford, CA 94305 USA
关键词
optical interconnects; transimpedance receiver; waveguides; repeaters; H-tree;
D O I
10.1016/S1386-9477(02)00686-0
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Miniaturization paradigm leads to a rapid performance deterioration of Copper wires in the future, despite lower dielectric constant materials between the lines. This work examines optical interconnects as an alternative for high performance silicon integrated circuits, and compares it with future metal interconnects. Both global signaling and clock distribution applications are considered. For clocking, power dissipation, where as, for global signaling, both power and delay are compared with metal-based interconnects. We show that for high switching activity, long global signaling wires, it is favorable to switch to optical interconnects on both power and delay account. Whereas, a metal-based interconnect system is more favorable for shorter links. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:620 / 627
页数:8
相关论文
共 7 条
[1]  
Floyd B. A., 1999, Proceedings of the IEEE 1999 International Interconnect Technology Conference (Cat. No.99EX247), P248, DOI 10.1109/IITC.1999.787135
[2]   The future of wires [J].
Ho, R ;
Mai, KW ;
Horowitz, MA .
PROCEEDINGS OF THE IEEE, 2001, 89 (04) :490-504
[3]   Technology and reliability constrained future copper interconnects - Part I: Resistance modeling [J].
Kapur, P ;
McVittie, JP ;
Saraswat, KC .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2002, 49 (04) :590-597
[4]  
KAPUR P, 2002, P 39 DES AUT C DAC N
[5]  
KEELER GA, 2002, P OPT COMP C TAIP TA
[6]   Scaling optoelectronic-VLSI circuits into the 21st century: A technology roadmap [J].
Krishnamoorthy, AV ;
Miller, DAB .
IEEE JOURNAL OF SELECTED TOPICS IN QUANTUM ELECTRONICS, 1996, 2 (01) :55-76
[7]  
Pollock C.R., 1995, FUNDAMENTALS OPTOELE