Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure

被引:99
作者
Chada, S
Fournelle, RA
Laub, W
Shangguan, D
机构
[1] Marquette Univ, Mat Sci & Engn Program, Milwaukee, WI 53201 USA
[2] Ford Motor Co, Visteon Automot Syst, Dearborn, MI 48121 USA
关键词
eutectic Sn-Ag solder; cu substrate; dissolution;
D O I
10.1007/s11664-000-0015-6
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The dissolution of Cu into molten Sn-3.8at.%Ag (Sn-3.5wt.%Ag) solder and its effect on microstructure were studied by light microscopy, scanning microscopy, and x-ray microanalysis. X-ray microanalysis of the average Cu content of samples soldered under various conditions showed that the amount of Cu dissolved during soldering increased with increasing soldering temperature and time and that the rate of dissolution could be described by a Nernst-Brunner equation. Microstructurally it was found that the volume fractions of primary beta(Sn) dendrites and eta-phase dendrites increase with increasing soldering temperature and time. The microstructural changes can be explained using Sn-Ag-Cu phase equilibrium data. A numerical method was developed for calculating the amount of Cu dissolved under non-isothermal conditions, which describes dissolution reasonably well.
引用
收藏
页码:1214 / 1221
页数:8
相关论文
共 9 条
[1]  
[Anonymous], 1995, Handbook of Ternary Alloy Phase Diagrams. Volume
[2]  
*ASM INT, 1992, ASM HDB, V3, P178
[3]   An improved numerical method for predicting intermetallic layer thickness developed during the formation of solder joints on Cu substrates [J].
Chada, S ;
Laub, W ;
Fournelle, RA ;
Shangguan, D .
JOURNAL OF ELECTRONIC MATERIALS, 1999, 28 (11) :1194-1202
[4]   Tin-silver-copper eutectic temperature and composition [J].
Loomans, ME ;
Fine, ME .
METALLURGICAL AND MATERIALS TRANSACTIONS A-PHYSICAL METALLURGY AND MATERIALS SCIENCE, 2000, 31 (04) :1155-1162
[5]   A VIABLE TIN-LEAD SOLDER SUBSTITUTE - SN-AG-CU [J].
MILLER, CM ;
ANDERSON, IE ;
SMITH, JF .
JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (07) :595-601
[6]  
MILLER CM, 1994, THESIS IOWA STATE U
[7]   A numerical method for predicting intermetallic layer thickness developed during the formation of solder joints [J].
Schaefer, M ;
Laub, W ;
Sabee, JM ;
Fournelle, RA .
JOURNAL OF ELECTRONIC MATERIALS, 1996, 25 (06) :992-1003
[8]  
Schaefer M, 1997, DESIGN & RELIABILITY OF SOLDERS AND SOLDER INTERCONNECTIONS, P247
[9]  
WASSINK RJK, 1989, SOLDERING ELECT, P141