Cluster-assembled carbon films with different nanostructures: a spectroscopic study

被引：17

作者：

Riedo, E

Magnano, E

Rubini, S

Sancrotti, M

Barborini, E

Piseri, P

Milani, P

机构：

[1] INFM, I-25121 Brescia, Italy

[2] Univ Cattolica Sacro Cuore, Dipartimento Matemat & Fis, I-25121 Brescia, Italy

[3] Univ Milan, Dipartimento Fis, I-20133 Milan, Italy

[4] INFM, Lab Nazl TASC, I-34012 Trieste, Italy

[5] INFM, I-20133 Milan, Italy

来源：

SOLID STATE COMMUNICATIONS | 2000年 / 116卷 / 05期

关键词：

thin films; nanostructures; electronic states; photoelectron spectroscopies; electron energy loss spectroscopy;

D O I：

10.1016/S0038-1098(00)00325-2

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Carbon thin films with different nanostructures grown by Cluster Beam Deposition are studied by means of Raman Spectroscopy, X-ray photoemission spectroscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the as grown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by deposition of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS. (C) 2000 Elsevier Science Ltd. All rights reserved.

引用

页码：287 / 292

页数：6

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