Phase-contrast tomography at the nanoscale using hard x rays

被引：98

作者：

Stampanoni, Marco ^{[1
,2
,3
]}

Mokso, Rajmund ^{[1
]}

Marone, Federica ^{[1
]}

Vila-Comamala, Joan ^{[1
]}

Gorelick, Sergey ^{[1
]}

Trtik, Pavel

Jefimovs, Konstantin ^{[4
]}

David, Christian ^{[1
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Univ Zurich, Inst Biomed Engn, CH-8092 Zurich, Switzerland

[3] ETH, CH-8092 Zurich, Switzerland

[4] EMPA, Mat Sci & Technol, CH-8600 Dubendorf, Switzerland

来源：

PHYSICAL REVIEW B | 2010年 / 81卷 / 14期

关键词：

ZONE PLATES; MICROSCOPY; RESOLUTION; CONDENSER; ILLUMINATION; IMAGES;

D O I：

10.1103/PhysRevB.81.140105

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Synchrotron-based full-field tomographic microscopy established itself as a tool for noninvasive investigations. Many beamlines worldwide routinely achieve micrometer spatial resolution while the isotropic 100-nm barrier is reached and trespassed only by few instruments, mainly in the soft x-ray regime. We present an x-ray, full-field microscope with tomographic capabilities operating at 10 keV and with an isotropic resolution of 144 nm. Custom-designed optical components allow for ideal, aperture-matched sample illumination and very sensitive phase contrast imaging. We show here that the instrument has been successfully used for the nondestructive, volumetric investigation of single cells.

引用

页数：4

共 22 条

[1] Nanofabrication and diffractive optics for high-resolution x-ray applications [J].