Nanoscale resistive switching in SrTiO3 thin films

被引:156
作者
Szot, K.
Dittmann, R.
Speier, W.
Waser, R.
机构
[1] Forschungszentrum Julich, Inst Festkorperforsch, D-52425 Julich, Germany
[2] Silesian Univ, Inst Phys, PL-40007 Katowice, Poland
[3] Rhein Westfal TH Aachen, Inst Werkstoffe Elektrotech, D-52056 Aachen, Germany
来源
PHYSICA STATUS SOLIDI-RAPID RESEARCH LETTERS | 2007年 / 1卷 / 02期
关键词
D O I
10.1002/pssr.200701003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The local conductivity of SrTiO3 thin films epitaxially grown on SrRuO3-buffered SrTiO3 single crystals has been investigated in detail with an atomic force microscope equipped with a conducting tip (LC-AFM). These experiments demonstrate that the conductivity of SrTiO3 thin films originates from nanoscale well-conducting filaments connecting the surface to the SrRuO3 bottom electrode. The electrical conduction of the filaments is shown to be reversible modulated over several orders of magnitude by application of an appropriate electrical field. We analyze the resistive switching by addressing individual filaments with the AFM tip as well as by scanning areas up to the mu m scale. Temperature dependent measurements reveal that resistive switching on a macroscopic scale can be traced down to the insulator-to-metal transition of the independently switchable filaments.
引用
收藏
页码:R86 / R88
页数:3
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