Evidence for trap-limited transport in the subthreshold conduction regime of chalcogenide glasses

被引:150
作者
Ielmini, Daniele
Zhang, Yuegang
机构
[1] Politecn Milan, Dipartimento Elettron & Informaz, I-20133 Milan, Italy
[2] IUNET, I-20133 Milan, Italy
[3] Intel Co, Santa Clara, CA 95054 USA
关键词
D O I
10.1063/1.2737137
中图分类号
O59 [应用物理学];
学科分类号
摘要
The study of the temperature dependence of subthreshold conduction in amorphous chalcogenide materials reveals a voltage dependent activation energy, which can be attributed to trap-limited conduction. The authors find that the features of subthreshold conduction regime (subthreshold slope and activation energy) can be quantitatively explained by a simple conduction model for Poole-Frenkel transport in the presence of a high concentration of traps. This analysis allows for an accurate prediction of the temperature and voltage dependence of subthreshold current in amorphous chalcogenides, and offers a simple scheme for estimating the average distance between traps in the disordered material. (C) 2007 American Institute of Physics.
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页数:3
相关论文
共 15 条
[1]   Innovative technologies for high density non-volatile semiconductor memories [J].
Bez, R .
MICROELECTRONIC ENGINEERING, 2005, 80 :249-255
[2]   SIMPLE BAND MODEL FOR AMORPHOUS SEMICONDUCTING ALLOYS [J].
COHEN, MH ;
FRITZSCHE, H ;
OVSHINSKY, SR .
PHYSICAL REVIEW LETTERS, 1969, 22 (20) :1065-+
[3]   POOLE-FRENKEL CONSTANT [J].
HILL, RM .
THIN SOLID FILMS, 1971, 8 (03) :R21-&
[4]  
Hwang YN, 2003, 2003 IEEE INTERNATIONAL ELECTRON DEVICES MEETING, TECHNICAL DIGEST, P893
[5]   Analysis of phase distribution in phase-change nonvolatile memories [J].
Ielmini, D ;
Lacaita, AL ;
Pirovano, A ;
Pellizzer, F ;
Bez, R .
IEEE ELECTRON DEVICE LETTERS, 2004, 25 (07) :507-509
[6]  
IELMINI D, 2006, IEDM, P401
[7]   VALENCE-ALTERNATION MODEL FOR LOCALIZED GAP STATES IN LONE-PAIR SEMICONDUCTORS [J].
KASTNER, M ;
ADLER, D ;
FRITZSCHE, H .
PHYSICAL REVIEW LETTERS, 1976, 37 (22) :1504-1507
[8]  
Lacaita AL, 2004, IEEE INTERNATIONAL ELECTRON DEVICES MEETING 2004, TECHNICAL DIGEST, P911
[9]   REVERSIBLE ELECTRICAL SWITCHING PHENOMENA IN DISORDERED STRUCTURES [J].
OVSHINSKY, SR .
PHYSICAL REVIEW LETTERS, 1968, 21 (20) :1450-+
[10]   LOCALIZED STATES IN GAP OF AMORPHOUS-SEMICONDUCTORS [J].
OVSHINSKY, SR .
PHYSICAL REVIEW LETTERS, 1976, 36 (24) :1469-1472