Study of microwave dielectric properties measurements by various resonance techniques

被引：98

作者：

Sheen, J ^{[1
]}

机构：

[1] Oriental Inst Technol, Dept Commun Engn, Taipei 220, Taiwan

来源：

MEASUREMENT | 2005年 / 37卷 / 02期

关键词：

microwave measurement; dielectric constant; dielectric loss; loss tangent; complex permittivity;

D O I：

10.1016/j.measurement.2004.11.006

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A systematic study on various resonance measurement techniques of dielectric constant and dielectric loss at microwave frequencies has been undertaken. Characteristics of various resonance techniques are compared with each other. Suggestion on how to select adequate measurement techniques of microwave dielectric properties is given. Practical measurements by different methods are made and the results are compared. The trend for future development is discussed. (C) 2004 Elsevier Ltd. All rights reserved.

引用

页码：123 / 130

页数：8

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