High-scan-range cryogenic scanning probe microscope

被引：12

作者：

Urazhdin, S ^{[1
]}

Maasilta, IJ ^{[1
]}

Chakraborty, S ^{[1
]}

Moraru, I ^{[1
]}

Tessmer, SH ^{[1
]}

机构：

[1] Michigan State Univ, Dept Phys & Astron, E Lansing, MI 48824 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 11期

关键词：

D O I：

10.1063/1.1315354

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We have designed and constructed a scanning probe microscope operable at temperatures down to 260 mK within a top-loading helium-3 cryostat. It achieves a large scan range with the sample situated near the bottom of the scanning head-maximizing the cooling efficiency of the liquid helium. The scan head is completely thermally compensated, thus eliminating thermal expansion and contraction on cooling and warm-up, as well as thermal drift during operation. We demonstrate the performance using two distinct scanning probe methods: scanning tunneling microscopy and charge accumulation imaging. (C) 2000 American Institute of Physics. [S0034-6748(00)03011-2].

引用

页码：4170 / 4173

页数：4

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