Infrared optical properties of Bi3.25La0.75Ti3O12 ferroelectric thin films using spectroscopic ellipsometry

被引:7
作者
Hu, ZG [1 ]
Wang, GS [1 ]
Huang, ZM [1 ]
Meng, XJ [1 ]
Chu, JH [1 ]
机构
[1] Chinese Acad Sci, Shanghai Inst Tech Phys, Natl Lab Infrared Phys, Shanghai 200083, Peoples R China
关键词
D O I
10.1088/0022-3727/35/24/311
中图分类号
O59 [应用物理学];
学科分类号
摘要
Bi3.25La0.75Ti3O12 (BLT) thin films have been grown on Pt/Ti/SiO2/Si substrates by chemical solution methods. X-ray diffraction analysis shows that the BLT thin films are polycrystalline with the preferential orientation. The infrared optical properties of the BLT thin films have been investigated using the infrared spectroscopic ellipsometry in the wave number range of 800-4000 cm(-1) (2.5-12.5 mum). By fitting the measured ellipsometric parameter (psi and Delta) data with a three-phase model (Air/BLT/Pt), and a derived classical dispersion relation for the thin films, the optical constants and thickness of the thin films have been obtained. The refractive index decreases as the wave number decreases, whereas the extinction coefficient increases. The absorption coefficient is very small and less than 100 cm(-1) for the wave numbers above 2027 cm(-1) (4.9 mum). However, it is higher than 1000 cm(-1) for the wave numbers under 830 cm(-1) (12.4 mum).
引用
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页码:3221 / 3224
页数:4
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