Optical and electrical characteristics of CO2-laser-treated Mg-doped GaN film

被引:18
作者
Lai, WC
Yokoyama, M
Chang, SJ
Guo, JD
Sheu, CH
Chen, TY
Tsai, WC
Tsang, JS
Chan, SH
Sze, SM
机构
[1] Natl Cheng Kung Univ, Dept Elect Engn, Tainan, Taiwan
[2] Natl Nano Device Lab, Hsinchu 30050, Taiwan
[3] Adv Epitaxy Technol Inc, Hsinchu, Taiwan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 2000年 / 39卷 / 11B期
关键词
CO2 laser treatment; MOCVD; P-GaN; laser power; activation;
D O I
10.1143/JJAP.39.L1138
中图分类号
O59 [应用物理学];
学科分类号
摘要
This work investigates the optical and electrical characteristics of CO2-laser annealed Mg-doped GaN films to activate Mg-doped p-type GaN films. Results obtained from the CO2 laser annealing investigation were similar to those of thermal annealing or low energy electron beam irradiation (LEEBI) treatment to activate the Mg-doped p-GaN films. The room-temperature photoluminescence (PL) intensity of the blue emission of the Mg-doped GaN him after 10 W laser annealing was approximately ten times stronger than that of the as-grown film. The resistivity of the Mg-doped GaN him decreased from 10(5) Omega .cm to 2-3 Omega .cm as the laser annealing power rose above 6 W. The hole concentration of Mg-doped GaN film was approximately 1 x 10(17) cm(-3) when the laser annealing power was 7.5 W.
引用
收藏
页码:L1138 / L1140
页数:3
相关论文
共 6 条
[1]  
AKASAKI I, 1995, JPN J APPL PHYS 2, V34, P1517
[2]   P-TYPE CONDUCTION IN MG-DOPED GAN TREATED WITH LOW-ENERGY ELECTRON-BEAM IRRADIATION (LEEBI) [J].
AMANO, H ;
KITO, M ;
HIRAMATSU, K ;
AKASAKI, I .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1989, 28 (12) :L2112-L2114
[3]  
Amano H., 1989, I PHYS C SER, V106, P725
[4]   InGaN-based multi-quantum-well-structure laser diodes [J].
Nakamura, S ;
Senoh, M ;
Nagahama, S ;
Iwasa, N ;
Yamada, T ;
Matsushita, T ;
Kiyoku, H ;
Sugimoto, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1996, 35 (1B) :L74-L76
[5]   HIGH-POWER GAN P-N-JUNCTION BLUE-LIGHT-EMITTING DIODES [J].
NAKAMURA, S ;
MUKAI, T ;
SENOH, M .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 1991, 30 (12A) :L1998-L2001
[6]  
Nakamura S., 1992, JPN J APPL PHYS, V31, P139