Test and evaluation of reference-based nonuniformity correction methods for microbolometer infrared detectors

被引：18

作者：

Orzanowski, T. ^{[1
]}

Madura, H. ^{[1
]}

机构：

[1] Mil Univ Technol, Inst Optoelect, PL-00908 Warsaw, Poland

来源：

OPTO-ELECTRONICS REVIEW | 2010年 / 18卷 / 01期

关键词：

microbolometer; nonuniformity correction; IRFPA signal processing;

D O I：

10.2478/s11772-009-0024-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In the paper, reference-based nonuniformity correction methods for microbolometer infrared detectors are discussed and tested. In order to evaluate their effectiveness, a complete readout circuit for amorphous silicon microbolometer focal plane array has been designed. The tests were carried out on a developed stand including several extended blackbodies. Some modification of standard two-point correction algorithm incorporating detectors response at external shutter to compensate offset drift is also proposed. The obtained results are presented.

引用

页码：91 / 94

页数：4

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