Phase-measuring profilometry of moving object without phase-shifting device

被引：25

作者：

Yoneyama, S ^{[1
]}

Morimoto, Y ^{[1
]}

Fujigaki, M ^{[1
]}

Yabe, M ^{[1
]}

机构：

[1] Wakayama Univ, Dept Optomechatron, Wakayama 6408510, Japan

来源：

OPTICS AND LASERS IN ENGINEERING | 2003年 / 40卷 / 03期

关键词：

profilometry; phase analysis; linear sensor; moving object; phase-shifting method;

D O I：

10.1016/S0143-8166(02)00100-8

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new phase-measuring surface profiling technique of a moving object is proposed in the present paper. An interference fringe pattern is projected onto the object that moves at a constant speed. Multiple linear sensors are used for recording the deformed fringe pattern on the object. The phase distribution along the recording line can be calculated using a phase-shifting algorithm without any phase-shifting devices. The length of a target is not limited and a long object can be measured by the proposed method. It is expected that the proposed method can be used for the profile inspection of products moving on a conveyor system in a factory. (C) 2002 Elsevier Science Ltd. All rights reserved.

引用

页码：153 / 161

页数：9

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