Comparative Monte Carlo study of electron transport in 3C, 4H and 6H silicon carbide

被引:3
作者
Mickevicius, R [1 ]
Zhao, JH [1 ]
机构
[1] Rutgers State Univ, Dept Elect & Comp Engn, Piscataway, NJ 08855 USA
来源
SILICON CARBIDE, III-NITRIDES AND RELATED MATERIALS, PTS 1 AND 2 | 1998年 / 264-2卷
关键词
electron transport; electron mobility; saturation velocity;
D O I
10.4028/www.scientific.net/MSF.264-268.291
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Temperature-and electric field-dependent electron transport in 3C, 4H, and 6H: SiC is studied by the Monte Carlo technique. Due to freeze-out of deep donor levels the role of ionized impurity scattering in 6H SiC is suppressed as compared to 4H SiC. There are in dications of impurity band formation for impurity concentrations exceeding 10(19) cm(-3) in 6H polytype. Electron effective masses and electron-phonon coupling constants are deduced by fitting the electron mobilities obtained by the Monte Carlo simulations to the available experimental data. The extracted model parameters are used for high-field electron transport; simulations. The calculated velocity-field dependences agree with experimental results.
引用
收藏
页码:291 / 294
页数:4
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