New magnetic properties of silicon/silicon oxide interfaces

被引：48

作者：

Kopnov, Gregory

Vager, Zeev

Naaman, Ron ^{[1
]}

机构：

[1] Weizmann Inst Sci, Dept Chem Phys, IL-76100 Rehovot, Israel

[2] Weizmann Inst Sci, Dept Particle Phys, IL-76100 Rehovot, Israel

来源：

ADVANCED MATERIALS | 2007年 / 19卷 / 07期

关键词：

D O I：

10.1002/adma.200601762

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

Silicon/silicon oxide interfaces are found to possess magnetic properties when the surface is etched to a specific morphology. By measuring the surface roughness (see figure) using atomic force microscopy, and monitoring the magnetic response as a function of magnetic field, the relation between the magnetism and the surface structure is established. The observations indicate that the magnetism is related to a cooperative effect on the surface.

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页码：925 / +

页数：5

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