A millimeter-wave near-field scanning probe with an optical distance control

被引：13

作者：

Golosovsky, M ^{[1
]}

Lann, A ^{[1
]}

Davidov, D ^{[1
]}

机构：

[1] Hebrew Univ Jerusalem, Racah Inst Phys, IL-91904 Jerusalem, Israel

来源：

ULTRAMICROSCOPY | 1998年 / 71卷 / 1-4期

关键词：

scanning probe; microwave imaging; near-field;

D O I：

10.1016/S0304-3991(97)00058-2

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

We describe the design of a near-field millimeter (mm) wave resistivity microscope with a resonant-slit probe with a special emphasis (i) on the probe fabrication and (ii) on the probe-sample separation control. We describe an optical and capacitive control of the probe-sample separation. We study dependence of the millimeter-wave reflectivity of different materials on the probe-sample distance. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：133 / 141

页数：9

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