Multiport-readout frame-transfer 5 megapixel CCD imaging system for TEM applications

被引:11
作者
Fan, GY [1 ]
Peltier, S
Lamont, S
Dunkelberger, DG
Burke, BE
Ellisman, MH
机构
[1] Univ Calif San Diego, Sch Med, Dept Neurosci, Natl Ctr Microscopy & Imaging Res, La Jolla, CA 92093 USA
[2] Grant Sci Corp, Gilbert, SC 29054 USA
[3] MIT, Lincoln Lab, Lexington, MA 02420 USA
关键词
CCD camera; digital imaging; electron scintillator; thin film screen;
D O I
10.1016/S0304-3991(00)00021-8
中图分类号
TH742 [显微镜];
学科分类号
摘要
A multiport-readout, frame-transfer charge-coupled device (CCD) digital imaging system has been successfully developed and tested for intermediate-high-voltage electron microscopy (IVEM) applications up to 400 keV. The system employs a back-thinned CCD with 2560 x 1960 pixels and a pixel size of 24 mu m x 24 mu m. In the current implementation, four of the eight on-chip readout ports are used in parallel each operating at a pixel rate of 1- or 2-MHz so that the entire CCD array can be read out in as short as 0.6 s. The frame-transfer readout functions as an electronic shutter which permits the rapid transfer of charges in the active pixels to four masked buffers where the charges are readout and digitized while the active area of the CCD is integrating the next frame. With a thin film-based phosphor screen and a high-performance lens relay, the system has a conversion factor of 2.1 digital units per incident electron at 400 keV, and a modulation transfer function value of 14% at the Nyquist frequency. (C) 2000 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:75 / 84
页数:10
相关论文
共 24 条
[1]  
AIKENS RS, 1989, METHOD CELL BIOL, V29, P291
[2]   APPLICATIONS OF A SLOW-SCAN CCD CAMERA IN PROTEIN ELECTRON CRYSTALLOGRAPHY [J].
BRINK, J ;
CHIU, W .
JOURNAL OF STRUCTURAL BIOLOGY, 1994, 113 (01) :23-34
[3]   ELECTRON DETECTION IN THE ANALYTICAL ELECTRON-MICROSCOPE [J].
CHAPMAN, JN ;
CRAVEN, AJ ;
SCOTT, CP .
ULTRAMICROSCOPY, 1989, 28 (1-4) :108-117
[4]   Development and performance of a fast fibre-plate coupled CCD camera at medium energy and image processing system for electron holography [J].
Daberkow, I ;
Herrmann, KH ;
Liu, L ;
Rau, WD ;
Tietz, H .
ULTRAMICROSCOPY, 1996, 64 (1-4) :35-48
[5]   PERFORMANCE OF ELECTRON IMAGE CONVERTERS WITH YAG SINGLE-CRYSTAL SCREEN AND CCD SENSOR [J].
DABERKOW, I ;
HERRMANN, KH ;
LIU, LB ;
RAU, WD .
ULTRAMICROSCOPY, 1991, 38 (3-4) :215-223
[6]   TOWARDS AUTOMATIC ELECTRON TOMOGRAPHY [J].
DIERKSEN, K ;
TYPKE, D ;
HEGERL, R ;
KOSTER, AJ ;
BAUMEISTER, W .
ULTRAMICROSCOPY, 1992, 40 (01) :71-87
[7]   Performance of a 2k CCD camera designed for electron crystallography at 400 kV [J].
Downing, KH ;
Hendrickson, FM .
ULTRAMICROSCOPY, 1999, 75 (04) :215-233
[8]   Accurate measurement of phase shift in electron holography [J].
Duan, XF ;
Gao, M ;
Peng, LM .
APPLIED PHYSICS LETTERS, 1998, 72 (07) :771-773
[9]   ASIC-based event-driven 2D digital electron counter for TEM imaging [J].
Fan, GY ;
Datte, P ;
Beuville, E ;
Beche, JF ;
Millaud, J ;
Downing, KH ;
Burkard, FT ;
Ellisman, MH ;
Xuong, NH .
ULTRAMICROSCOPY, 1998, 70 (03) :107-113
[10]   TELEMICROSCOPY [J].
FAN, GY ;
MERCURIO, PJ ;
YOUNG, SJ ;
ELLISMAN, MH .
ULTRAMICROSCOPY, 1993, 52 (3-4) :499-503