Determination of thermal parameters of microbolometers using a single electrical measurement

被引:32
作者
Gu, X
Karunasiri, G [1 ]
Chen, G
Sridhar, U
Xu, B
机构
[1] Natl Univ Singapore, Ctr Optoelect, Dept Elect Engn, Singapore 119260, Singapore
[2] Inst Microelect, Singapore 117685, Singapore
关键词
D O I
10.1063/1.121214
中图分类号
O59 [应用物理学];
学科分类号
摘要
Accurate determination of thermal parameters of microbolometer-based sensors is of considerable interest for many applications. The most important parameters are thermal time constant, heat capacitance and thermal conductance. In this work, we have developed a technique to measure all three quantities using a single electrical measurement. The method involves the measurement of time dependent output voltage of a balanced Wheatstone bridge containing a microbolometer under pulse bias condition. The validity of the approach is verified experimentally using metal-him microbolometers. The experimental results are in excellent agreement with the theoretical analysis of the measurement technique. (C) 1998 American Institute of Physics.
引用
收藏
页码:1881 / 1883
页数:3
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