Selection of candidate doped graphite materials as plasma facing components for HT-7U device

被引:29
作者
Guo, QG
Li, JG
Noda, N
Kubota, Y
Chen, JL
Liu, ZJ
Liu, L
Song, JR
机构
[1] Chinese Acad Sci, Inst Coal Chem, Taiyuan 30001, Shanxi, Peoples R China
[2] Chinese Acad Sci, Inst Plasma Phys, Hefei 230031, Anhui, Peoples R China
[3] Natl Inst Fus Sci, Toki 5095292, Japan
关键词
doped graphite; plasma facing component; TDS; high heat flux test; HT-7U; B2-EIRENE code;
D O I
10.1016/S0022-3115(02)01399-5
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Selection of candidate materials for plasma facing material (PFM) in HT-7U device, and plasma-wall interactions are critically important to reach high plasma performance. Based on concentrated research on multi-element doped graphite containing B, Si and Ti, two kinds of doped graphites have been chosen as candidates for PFM in HT-7U. Doped graphite GBST1308 with the dopant concentration of 1% B, 2.5% Si, 7.5% Ti was developed as low-Z PFM for reducing the chemical sputtering and suppressing the radiation enhanced sublimation, and successfully used as the new limiter material in last two campaigns of HT-7 tokamak experiments. Doped graphite with the composition of 2.5% Si, 7.5% Ti has improved mechanical properties and thermal conductivity of 314 W/m K at room temperature. TDS and high heat flux experiments results demonstrated that such doped graphites are promising candidate plasma facing components for HT-7U. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:144 / 148
页数:5
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