Digital imaging in transmission electron microscopy

被引：47

作者：

Fan, GY ^{[1
]}

Ellisman, MH ^{[1
]}

机构：

[1] Univ Calif San Diego, Sch Med, Dept Neurosci, Natl Ctr Microscopy & Imaging Res, La Jolla, CA 92093 USA

来源：

JOURNAL OF MICROSCOPY | 2000年 / 200卷 / 01期

关键词：

ASIC; CCD camera; electron scintillator; imaging plate; TEM;

D O I：

10.1046/j.1365-2818.2000.00737.x

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

The digital revolution currently under way, as evidenced by the rapid development of the Internet and the world-wide-web technologies, is undoubtedly impacting the field of transmission electron microscopy (TEM). Digital imaging systems based on charge-coupled device (CCD) technologies, with pixel array size up to 2 k x 2 k at the present and increasing, are available for TEM applications and offer many attractions. Is it time to phase out film cameras on TEMs and close the darkrooms for good? This paper reviews digital imaging technologies for TEM at different voltages, and contrasts the performance of digital imaging systems with that of TEM film. The performance characteristics of CCD-based digital imaging systems, as well as methods for assessing them, are discussed. Other approaches to digital imaging are also briefly reviewed.

引用

页码：1 / 13

页数：13

共 43 条

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