Ptychographic characterization of the wavefield in the focus of reflective hard X-ray optics

被引：87

作者：

Kewish, Cameron M. ^{[1
]}

Thibault, Pierre ^{[1
]}

Dierolf, Martin ^{[2
]}

Bunk, Oliver ^{[1
]}

Menzel, Andreas ^{[1
]}

Vila-Comamala, Joan ^{[1
]}

Jefimovs, Konstantins ^{[3
]}

Pfeiffer, Franz ^{[2
]}

机构：

[1] Paul Scherrer Inst, CH-5232 Villigen, Switzerland

[2] Tech Univ Munich, D-85748 Garching, Germany

[3] EMPA, CH-8600 Dubendorf, Switzerland

来源：

ULTRAMICROSCOPY | 2010年 / 110卷 / 04期

关键词：

X-ray optics; Wavefront characterization; Ptychography; Phase retrieval; Diffractive imaging; MICROSCOPY; RESOLUTION; DETECTOR; PHASE;

D O I：

10.1016/j.ultramic.2010.01.004

中图分类号：

TH742 [显微镜];

学科分类号：

摘要：

A technique for quantitatively characterizing the complex-valued focal wavefield of arbitrary optics is described and applied to reconstructing the coherent focused beam produced by a reflective/diffractive hard X-ray mirror. This phase-retrieval method, based on ptychography, represents an important advance in X-ray optics characterization because the information obtained and potential resolution far exceeds that accessible to methods of directly probing the focus. Ptychography will therefore be well-suited for characterizing and aligning future nanofocusing X-ray optics. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：325 / 329

页数：5

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