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Optical gate action of a molecular thin film probed with femtosecond near-field optical microscopy

被引：14
作者：
Kawashima, H
Furuki, M
Tatsuura, S
Tian, M
Sato, Y
Pu, LS
Tani, T
机构：
[1] Electrotech Lab, Tsukuba, Ibaraki 3058568, Japan
[2] Femtosecond Technol Res Assoc, FESTA Labs, Tsukuba, Ibaraki 3052635, Japan
[3] Fuji Xerox Co Ltd, Corp Res Ctr, Kanagawa 2590157, Japan
[4] Tokyo Univ Agr & Technol, Dept Appl Phys, Tokyo 1848588, Japan
来源：
APPLIED PHYSICS LETTERS | 2000年 / 77卷 / 09期
关键词：
D O I：
10.1063/1.1289902
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
We have combined a near-field scanning optical microscope with a two-color time-resolved pump-probe measurement system. The sample was a molecular thin film that revealed an excitonic resonance and also had a characteristic domain structure. The measurement system has a noise-equivalent transmittance change as small as 5.0x10(-5) for a probe pulse with an intensity of 30 nW, which allows us to detect an optical gate action of a single domain. The results suggest that the film composition is uniform over a distance of several microns while it may vary on a greater scale. (C) 2000 American Institute of Physics. [S0003-6951(00)00135-2].
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收藏
页码：1283 / 1285
页数：3
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