The role of hole leakage in 1300-nm InGaAsN quantum-well lasers

被引:64
作者
Tansu, N [1 ]
Mawst, LJ [1 ]
机构
[1] Univ Wisconsin, Reed Ctr Photon, Dept Elect Comp Engn, Madison, WI 53706 USA
关键词
D O I
10.1063/1.1558218
中图分类号
O59 [应用物理学];
学科分类号
摘要
We calculate the thermionic escape times of electrons and holes in InGaAsN and InGaAs quantum wells using the most recent input data. The short thermionic escape time of holes from the InGaAsN quantum well indicates that hole leakage may be a significant factor in the poorer temperature characteristics of InGaAsN quantum-well lasers compared to those of InGaAs devices. We suggest a structure that results in an increased escape time, which will allow the reduction of hole leakage in these devices. (C) 2003 American Institute of Physics.
引用
收藏
页码:1500 / 1502
页数:3
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