X-ray characterization of residual stresses in electroplated nickel used in LIGA technique

被引:44
作者
Basrour, S [1 ]
Robert, L [1 ]
机构
[1] CNRS, Lab Phys & Metrol Oscillateurs, F-25044 Besancon, France
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2000年 / 288卷 / 02期
关键词
electroplating; nickel; residual stresses; x-ray; LIGA;
D O I
10.1016/S0921-5093(00)00868-6
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Pertinent simulations of micro-electromechanical systems using powerful computer-aided design tools depend on a systematic characterization of the electrical, optical, magnetic, and mechanical properties of the different materials involved in the fabrication of microdevices. Among these properties, we focused our attention on the residual stresses, which may be responsible for the degradation of the mechanical performances of micro-actuators and sensors. We report in this paper a detailed investigation of the residual stresses arising during nickel electroplating used in the LIGA technique. X-ray analysis and, in particular the sin(2) Psi method allow a local characterization of the structural properties of the material as well as the residual stress tensor. The experimental results obtained on our nickel plates obtained with a nickel sulphamate electrolyte show that the structural properties and the residual stresses are tightly linked to the nature of the substrates used for the depositions (silicon and copper), the densities of current, the amount of NiCl2 in the bath and the thickness of the layers. In order to obtain the intrinsic stresses, the thermoelastic contribution to the global stresses is estimated with a finite element method and subtracted to the experimental values. In the final part of this paper, we present the effect of residual stresses in the mechanical behavior of a microgripper fabricated by LIGA. (C) 2000 Elsevier Science S.A. All rights reserved.
引用
收藏
页码:270 / 274
页数:5
相关论文
共 7 条
[1]   RESIDUAL-STRESS DETERMINATION IN A 1000 A TUNGSTEN THIN-FILMS BY X-RAY-DIFFRACTION [J].
BADAWI, KF ;
DECLEMY, A ;
NAUDON, A ;
GOUDEAU, P .
JOURNAL DE PHYSIQUE III, 1992, 2 (09) :1741-1748
[2]   Microgrippers fabricated by the LIGA technique [J].
Ballandras, S ;
Basrour, S ;
Robert, L ;
Megtert, S ;
Blind, P ;
Rouillay, M ;
Bernede, P ;
Daniau, W .
SENSORS AND ACTUATORS A-PHYSICAL, 1997, 58 (03) :265-272
[3]  
BECKER EW, 1982, NATURWISSENSCHAFTEN, V69, P520, DOI 10.1007/BF00463495
[4]  
CASTEX L, 1981, PUBLICATIONS SCI TEC, V22
[5]  
GUERIN LJ, 1997, P TRANSD 97 CHIC IL, P1419
[6]  
HODGMAN C, 1955, HDB CHEM PHYSICS
[7]  
Noyan I. C., 1987, RESIDUAL STRESS MEAS